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基于元胞自动机理论的硅各向异性腐蚀模型 被引量:1

Cellular-Automata-Based Modeling of Silicon Anisotropic Etching
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摘要 根据硅各向异性腐蚀在微观尺度下的特点,基于元胞自动机理论提出了新的腐蚀模拟模型.该模型考虑了腐蚀过程中硅不同晶面的晶体结构特点,并通过引入碰撞理论,综合反映了腐蚀温度和浓度对腐蚀的影响作用.该模型可快速准确地模拟分析各向异性腐蚀工艺过程,对优化工艺有着理论指导作用. Based on the theory of cellular automata, a novel simulation model is proposed to describe the characteristics of silicon anisotropic etching. The influence of silicon crystal structure in different planes during the etching process are considered. Moreover, the collision theory is also introduced into this model, taking many factors into account, such as etching temperature, etchant concentration,and effective particle concentration. With this model, the simulation and analysis of the silicon anisotropic etching process could be carried out rapidly and accurately, which would theoretically direct how best to optimize the processes.
出处 《Journal of Semiconductors》 EI CAS CSCD 北大核心 2005年第8期1671-1675,共5页 半导体学报(英文版)
基金 国家自然科学基金(批准号:60236010 60225014) 江苏省自然科学基金(批准号:DK2004211) 国家高技术研究发展计划(批准号:2003AA302740)资助项目~~
关键词 元胞自动机 各向异性腐蚀 碰撞理论 cellular automata anisotropic etching collision theory
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参考文献12

  • 1Tsaur J J,Du C H,Lee Chengkuo. Investigation of TMAH for front-side bulk micromachining process from manufacturing aspect. Sensors and Actuators A,2001,92:375
  • 2Saitoh M,Hiramoto T. Extension of Coulomb blockade region by quantum confinement in the ultrasmall silicon dot in a single-hole transistor at room temperature. Appl Phys Lett,2004,84(16) :3172
  • 3张佩君,黄庆安.硅各向异性腐蚀速率图的模拟[J].固体电子学研究与进展,2002,22(1):89-92. 被引量:8
  • 4张佩君,黄庆安.基于MATLAB的硅各向异性腐蚀过程模拟[J].Journal of Semiconductors,2002,23(4):440-444. 被引量:8
  • 5姜岩峰,黄庆安,吴文刚,郝一龙,杨振川.硅在KOH中各向异性腐蚀的物理模型[J].Journal of Semiconductors,2002,23(4):434-439. 被引量:11
  • 6Oldham W E,Neureuther A R,Sung C,et al. A general simulator for VLSI lithography and etching processes:Par Ⅱ-Application to deposition and etching. IEEE Trans Electron Devices, 1980 ,ED-27 (8): 1455
  • 7Matsuzawa T,Ito T,Tanuma M. Three-dimensional photoresist image simulation on flat surface. IEEE Trans Electron Devices, 1985 ,ED-32(9): 1781
  • 8Hubbard T J,Antonsson E K. Cellular automata modeling in MEMS design. Sensors and Materials, 1997,9(7): 437
  • 9Marchetti J, He Y, Than O, et al. Efficient process development for bulk silicon etching using cellular automata simulation techniques. SPIE 1998 Symposium on Micromachining and Microfabrication, Micromachined Devices and Components, 1998 :20
  • 10Calidonna C R,Naddeo A. Towards a CA model for quantum computation with fully frustrated linear Josephson junction arrays. Phys Lett A,2004,327(5/6) :409

二级参考文献6

共引文献24

同被引文献9

  • 1姜岩峰,黄庆安.硅各向异性腐蚀的原子级模拟[J].Journal of Semiconductors,2005,26(3):618-623. 被引量:5
  • 2周再发,黄庆安,李伟华,王涓,孙岳明.元胞自动机方法模拟硅的各向异性腐蚀研究[J].固体电子学研究与进展,2006,26(1):128-133. 被引量:1
  • 3周再发,黄庆安,李伟华,王涓,孙岳明.硅各向异性腐蚀模拟的3-D连续CA模型研究[J].仪器仪表学报,2006,27(6):551-555. 被引量:3
  • 4Than O, Buttgenbach S. Simulation of anisotropic chemical etching of crystalline silicon using a cellular automata model. Sensors and Actuators, 1994, A45: 85
  • 5Hubbard T J. MEMS design: the geometry of silicon micromachining. Ph D Dissertation, California: California Institution of Technology, 1994
  • 6Marchetti J, He Y, Than O, et al. Efficient process development for bulk silicon etching using cellular automata simulation techniques. SPIE' s Symposium on Micromaching and Microfabrication, Micromachinged Devices and Components,Santa Clara, USA, 1998 : 1
  • 7Zhu Z, Liu C. Micromachining process simulation using a continuous cellular automata method. Journal of Microelectromechanical Systems, 2000,9 (2) : 252
  • 8Zhou Z F,Huang Q A, Li W H,et al. A 3-D simulator for silicon anisotropic wet chemical etching process based on cellular automata, Journal of Physics: Conference Series, 2006,34:674
  • 9Gosalvez M A,Nieminen R M,Kilpinen P,et al. Anisotropic wet chemical etching of crystalline silicon:Atomistic Monte-Carlo simulations and experiments. Appl Surf Sci, 2001,178 (1):7

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