摘要
应用Ｘ射线荧光法，直接测定了优质印刷用电分片中的卤素比，与传统的化学法相比，该法具有简单、快速、准确的特点。
X-ray fluorescence spectrometry is employed tO determine directly the halogen ratio in high quality lithographic film without preliminary sample preparation.The principle and experimental techniques of the method are given in detail.The method is characterized by its simplicity,rapidity and accuracy.
出处
《分析测试技术与仪器》
1996年第1期37-39,共3页
Analysis and Testing Technology and Instruments
关键词
印刷片
乳剂
卤化银
X射线荧光
感光材料
卤素比
Lithographic film Photographic emulsion
Silver halide
X-ray fluonscence
Sensitive material
