摘要
本文介绍了一个能对半导体激光器进行老化测试的智能控制系统。相对于已有系统,该系统采用一个经过MAT-LAB优化设计的半导体激光器驱动电路,电路结构更为简单。控制系统能够同时在恒定电流老化筛选和恒定光功率老化筛选模式下,对多个半导体激光器进行老化测试。该系统的实验表明,工作稳定,性能良好。
In this paper, a smart control system for semiconductor laser ageing test is described. Compared to prior system2, this system can work in constant current aging mode and in constant power aging mode at the same time based on a new driver circuit which is designed and optimized by MATLAB. The experiment tell that the control system perform well enough to apply in LD aging test.
出处
《微计算机信息》
北大核心
2005年第08S期30-31,83,共3页
Control & Automation
基金
国家863成果产业化技术研究资金资助项目项目编号:H010110310112
