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透射电子显微镜像差的简化分析

The simplified analysis of the aberration of the transmission Electron Microscope
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摘要 通过对透射电子显微镜像差的简化分析,得到在透射电子显微过程中最佳离焦量的选择原理,并进一步讨论了消除像差影响的方法,给电子透射显微像的数字模拟提供了较简便的处理方法. Based on the simplified analysis of the aberration of the transmission electronic microscope, the principle of selecting optimum defocus in the image is carried. Furthermore, the method of eliminating the aberration is discussed which is simply used in the digital simulation of transmission electronic microcopy.
出处 《山东理工大学学报(自然科学版)》 CAS 2005年第4期56-61,共6页 Journal of Shandong University of Technology:Natural Science Edition
关键词 像差 球差 离焦量 aberration, spherical defocus, optimum defocus
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