期刊文献+

基于有限元分析法的激光剥离技术中GaN材料瞬态温度场研究 被引量:1

Transient Temperature Field Study of GaN Material in Laser Lift-off Technique Based on Finite Element Method
原文传递
导出
摘要 用有限元分析法模拟计算Al2O3/GaN的激光剥离,分析了采用不同能量密度脉冲激光辐照时GaN材料内的瞬态温度场分布。采用波长248 nm的KrF准分子激光器对Al2O3/GaN样品进行激光剥离实验,实验结果与有限元数值模拟结果一致。分析了影响GaN材料温度场分布的因素,在激光光源一定的条件下,温度随时间和深度变化较快。在实现激光剥离时,脉冲激光的能量密度应不低于阈值条件,但为了避免温度过高对器件产生损伤,脉冲激光的能量密度存在上限。多脉冲激光辐照时,脉冲频率是另一关键参量,计算得到了不同能量密度的脉冲激光辐照时频率的选取范围。 Transient temperature field of GaN material irradiated by pulse laser with different energy density was simulated and analyzed for Al2O3/GaN laser lift-off technique using the finite element method (FEM). Al2O3/GaN lift-off experiment has also been carried out using 248 nm KrF excimer laser. The simulated results using FEM were consistent well with experiment results. It was found that for the certain laser source, the temperature varied quickly with time and depth in GaN material, and the energy density of pulse laser should be no less than the threshold energy density in order to realize lift-off successfully and no more than the maximum value for avoiding damage caused by too high temperature. During multi-pulse laser processing, another key parameter was pulse frequency, whose variation range was calculated as the function of the energy density of laser.
出处 《中国激光》 EI CAS CSCD 北大核心 2005年第9期1295-1299,共5页 Chinese Journal of Lasers
基金 国家973计划项目(20000683-02) 北京市教委项目(2002kj018) 北京工业大学博士启动基金(kz0204200387) 北京市科委重点项目(D0404003040221)资助课题
关键词 光电子学 激光剥离 温度场 有限元 GAN材料 optoelectronics laser lift off temperature field finite element method GaN material
  • 相关文献

参考文献3

二级参考文献15

  • 1Gon NamKoong, W. Alan Doolittle. April S. Brown et al..Role of sapphire nitridation temperature on GaN growth by plasma assisted molecular beam epitaxy: part I. Impact of the nitridation chemistry on material characteristics[J]. J. Appl.Phys. , 2002. 91(4):2499-2507.
  • 2K. W. Mah. J.-P. Mosnier, E. McGlynn et al.. Study of photolumineseence at 3. 310 and 3. 368 eV in GaN/sapphire(0001) and GaN/GaAs (00l) grown by liquid target pulsed-laser deposition [J]. Appl. Phys. Lett. , 2002, 80(18) :3301-3303.
  • 3Mitsuo Okamoto, Yoke Khin Yap, Masashi Yoshimura et al..The ohmic character of doped AIN films[J]. Diamond and Related Materials, 2001, 10:1322-1325.
  • 4G. Y. Zhang. Y. Z. Tong, Z. J. Yang et al.. Relationship of background carrier concontrtation and defecty in GaN grown by metalorganic vapor phase epitaxy [J]. Appl. Phys. Lett.,1997, 71(23):3376-3378.
  • 5刘恩克 朱秉升 罗晋升.半导体物理[M].西安:西安交通大学出版社,1998.56-76.
  • 6D. H. Zhang. H. L. Ma. Scattering mechanism of carriery in transparent conducting oxide films [J]. Appl. Phys. A, 1996,62:487-492.
  • 7H. Y. Huang, C. H. Chuang, C. C. Shu et al..Photoluminescence and photoluminescence excitation studies of as -grown and p implanted GaN: on the nature of yellow luminescence [J]. Appl. Phys. Lett., 2002. 80(18):3349-3351.
  • 8C. J. Pan, G. C. (7hi. The doping of GaN with Mg diffusion[J]. Solid State Electron. , 1999, 43:621-623.
  • 9宋航,Park S H,Kang T W,Kim T W.分子束外延高Mg掺杂GaN的发光特性[J].发光学报,1999,20(2):148-151. 被引量:2
  • 10汪洪海,郑启光,丘军林,熊贵光,田德成.激光熔蚀反应淀积AlN薄膜残余应力及热稳定性的研究[J].中国激光,2000,27(9):857-860. 被引量:4

共引文献17

同被引文献11

引证文献1

二级引证文献2

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部