期刊文献+

K9基片的亚表面损伤探测及化学腐蚀处理技术研究 被引量:11

Studies on subsurface damage detection and wet-etching process of K9 optics
下载PDF
导出
摘要 研究了几种类型的腐蚀液对K9基片化学腐蚀的影响。通过腐蚀液对基片纵向腐蚀速度的变化初步判断了K9基片重沉积层的深度。考察了腐蚀前后基片表面参数的变化以及腐蚀对激光损伤阈值的影响。研究表明,特定的腐蚀液能够对K9基片进行平稳可控的腐蚀,并且腐蚀能提高其激光损伤阈值,其主要原因是去除了重沉积层及表面、亚表面缺陷中的污染物,但过多的腐蚀会暴露本来为重沉积层所掩盖的划痕等亚表面缺陷,所以腐蚀并非越深越好。同时,表面各种杂质与缺陷的去除能够提高材料的机械强度,从而也有利于提高材料的激光损伤阈值。 Effects of wet-etching with four kinds of etching solution on the surface of K9 optical components were examined. By investigating the change pattern of wet-etching rate at different depth and surface parameters before and after corrosion, the depth of polishing redeposition layer was estimated. When etched to the depth of 600 nm, the loose polishing redeposition layer and the subsurface damage of the optics were mostly removed, hence the laser damage threshold was improved. However, with 1 500 nm in etching depth, the subsurface flaws and cracks appeared which lowered the laser damage threshold of the optics. The result shows that certain solution etches K9 optics with controllable rate and the laser damage threshold of the optics is improved.
出处 《强激光与粒子束》 EI CAS CSCD 北大核心 2005年第9期1289-1293,共5页 High Power Laser and Particle Beams
基金 中国工程物理研究院科学技术基金面上资助课题(20030216)
关键词 化学腐蚀 亚表面缺陷 激光损伤阈值 重沉积层 Wet-etching Subsurface damage Laser-induced damaged threshold Polishing redeposition layer
  • 相关文献

参考文献5

  • 1Burnham A K, Hackel L, Wegner P. Improving 351-nm damage performance of large-aperture fused silica and DKDP optics [A]. Proc of SPIE [C]. 2002, 4679: 173-185.
  • 2Yoshiyama J, Genin F Y. A study of the effects of polishing, etching, cleaving, and water leaching on the UV laser damage of fused silica [A]. Proc of SPIE[C]. 1997, 2744: 220-225.
  • 3Camp D W,Kozlowski M R,Sheehan I M, et al. Subsurface damage and polishing compound affect the 355-nm laser damage threshold of fused silica surfaces [A]. Proc of SPIE [C]. 1998, 3244: 356-364.
  • 4Salleo A, Genin F,Yoshiyama J. Laser-induced damage of fused silica initiated at scratches [A]. Proc of SPIE [C]. 1997, 3047: 987-999.
  • 5Hed P P, Edwards D F,Davis J B. Subsurface damage in optical materials: origin measurement and removal [R].NTIS 1998,Report UCRL99548,CONF-881187-1.

同被引文献100

引证文献11

二级引证文献56

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部