摘要
对102×64点阵的单色被动驱动的有机电致发光(OLED)矩阵屏进行了老化研究。矩阵屏的结构为ITO/CuPc/NPB/Alq3∶C545/LiF/Al。测量了老化前后矩阵屏的电流-电压-亮度曲线,以及电致发光(EL)和光致发光光谱(PL)。比较发现,老化后的器件在同样恒电流的情况下表现出更高的驱动电压,更小的漏电流,以及在阴极和有机层界面上电致发光和光致发光的光谱强度减弱。矩阵屏在老化17 h后,电致发光和光致发光的强度分别降低到初始值的75.6%和81.4%,分析认为,这是因为老化过程中部分发光材料分解,从而造成对矩阵屏的永久损伤。
The decay process of 102 × 64 monochromatic passive matrix organic light-emitting diode (PMOLED) displays is studied. The structure of the device is ITO( indium tin oxide )/CuPc(copper pht halocyanine)/NPB( N, N'-di ( naphthalene-l-yl )-N, N'-diphenyl-benzidine) / Alq3 ( tris-( 8hydroxyquinoline)aluminum) : C545 (coumarin)/Alq:3/LiF/Al. Electrical (I-V) and optical characterizations are measured, the EL and PL spectra before and after the aging test are analyzed . The aged device under constant current appeared higher driving voltage, smaller leak current, lower EL and PL intensities which come from the peeling of cathode/organic layers, the burning of shorted routes between the electrodes and the decomposition of light-emitting materials. The EL intensity remains 75.6 % while the PL does 81.4 % of their initials values after 17 h aging, which means the EL and PL decay simultaneously. The decomposition of emissive material is dominant in the decay process and results in the permanent damage in the display panel.
出处
《液晶与显示》
CAS
CSCD
北大核心
2005年第5期401-405,共5页
Chinese Journal of Liquid Crystals and Displays
基金
国家自然科学基金(No.50243020)
国家"863"资助(No.2002AA303230)
国家"973"(No.2002CB613405)资助项目
关键词
有机电致发光
老化
被动驱动
organic light emitting diodes
decay
passive matrix