摘要
提出一种考虑速度过冲效应的HEMT器件I-V特性解析模型.在非线性电荷控制模型的基础上,对栅极下面沟道中靠近源端附近的电场采用弱强阶梯场近似,提出了一个半经验的速度过冲模型.经实际计算结果表明。
A novel analytical current voltage characteristics model including velocity overshoot effect for HEMT devices is presented. Based on a more accurate nonlinear charge control formulation, a new velocity overshoot model is developed by the step field approximation for the electrical field near the source end of the channel. The results compared with the measured data show that this model is suitable for CAD applications of higher accuracy.
出处
《东南大学学报(自然科学版)》
EI
CAS
CSCD
1996年第4期15-19,共5页
Journal of Southeast University:Natural Science Edition
基金
国家"八五"攻关项目资助
关键词
电流-电压特性
异质结
场效应晶体管
速度过冲
current voltage characteristics
heterojunction field effect transistor
velocity overshoot