摘要
分辨率和空间位置定位精度是合成孔径雷达（Synthetic Aperture Radar，SAR）图像的重要参数。传统成像模型是建立在同一均匀媒质的假设上，而地表穿透合成孔径雷达（Gmund PENetration SAR，GPEN SAR）为了探测掩埋在地下的目标，通常工作在多层媒质的环境中，传统模型不再适合。文章首先建立了分区均匀媒质中的成像模型，在此模型基础上，推导了两层媒质时后向投影算法的积累轨迹误差。然后利用实际与理论方位分辨率之比、积分旁瓣比和定位偏差定量分析了两层媒质表面的折射效应对成像质量和定位精度的影响，为校正土壤折射对成像的影响提供有益参考。
Resolution and locating precision are important parameters for Synthetic Aperture Radar （SAR）. The traditional imaging model is based on homogeneous media assumption, which is not suitable for Ground Penetration SAR （GPEN SAR） working in multiple media condition in order to detect buried targets. A new imaging model considering multiple media is studied in this paper. And then the accumulating trace error is derived based on the model in two-media condition. The effects of refraction between the two-media surface are quantitatively analyzed in terms of ratio of true and theory azimuth resolution, integral side-lobe ratio and locating bias. The quantitative analysis gives valuable suggestions for correction of refraction effects on SAR images.
出处
《电子对抗》
2005年第5期16-21,26,共7页
Electronic Warfare
