氮离子束注入诱变小麦的研究(英文)

Studies on Wheat Mutants Induced by Nitrogen Ion Beam Implantation

和其他诱变方法相比较,低能氮离子束注入作为一种新的诱变方法具有生理损伤小、突变谱广和突变频率高等特点。据此利用该方法处理“遗4212”,建立起具有60个株系的突变群体。通过调查生育期、农艺性状、醇溶蛋白和微卫星的变异,对后代M4群体进行系统的研究。结果表明:群体的生育期和农艺性状变异明显,有7个ω-醇溶蛋白的迁移率变异并伴随着蛋白的缺失和增加;在25个SSR位点出现扩增产物的缺失、延长和缩短。结合实验结果和其他相关报道,讨论了实验所获得突变体的应用及离子束注入引发突变的机理。

As a new resource of mutagens,low-energy ion beam implantation is characterized as limited physiological damages,wide mutation spectrum,and high mutation frequency in comparison with the mutations from other inducing methods. We treated a wheat doubled haploid line Yi4212 with this technique by nitrogen ion and established a mutant population with 60 lines in our lab. The mutant lines were systematically investigated about their -developmental periods,agronomical performances,gliadin contents and microsatellite variations in M4 generation. The results revealed that in addition to extensive changes of the developmental, agronomical and economical traits of the mutants,the moblities in acid-PAGE of 7 ω-gliadin subunits were also showed changes as some gliadins lacked and novel gliadins obtained. Deletion ,expansion and contraction of SSR amplification products occured frequently in 25 SSR loci in the mutants. Combined with our results and other reports,the application prospects of those wheat mutants and the mutation mechanism by ion beam implantation are discussed.