电子实验中的故障构成与分析

Formation and analysis of the troubles in electronic experiments

主要故障可归纳为二大类:一是元器件功能的失效或元器件参数的偏差所造成的实验故障;二是元器件由于开路、短路所引发的实验故障。元器件的可靠性是实验电路可靠性的基础。元器件的寿命取决于自身质量、工作条件、环境条件。找出故障的模式,分析故障的现象及规律,得出减少故障的方法,有助于提高实践性教学的质量。

The main troubles in electronic experiments can be grouped as follows： 1. troubles caused by malfunction of the components or errors in the component parameters; 2. troubles caused by the components because of open circuit or short circuit. The reliability of experimental circuit is based on the reliability of the components. The service life of the components relies on their own quality, their working condition and their environmental condition. We can improve the quality＇ of experimental teaching and learning by working out the pattern of troubles, analyzing their phenomena and regularity, and finding out solutions to reduce troubles.