基于虚拟机的半导体封装测试数据获取技术研究

A Study on Data Acquiring Technique in Semiconductor Packaging Test Based on Virtual Machine

针对半导体封装测试机机型多、数据文件格式不统一、数据获取难的问题,提出了一种基于虚拟机的数据获取接口技术。该技术提供了描述数据文件格式的解释语言,通过建立变量类型表、变量查找表、操作符号表、函数查找表等线性查找表,对测试数据文件进行动态解释和翻译,柔性的实现了多机型数据获取软件接口。

It is hard to acquire test data form variant type of semiconductor packaging test machine, because the data format of variant machine is different. A data acquiring technique based on virtual machine is introduced to solve this problem. In this technique, the format of test data file is described and the test data file will be dynamically decoded and translated by variable type table, variable search table, operate symbol table, function search table and so on. As a result, multi machine data interface is established flexibly by this technique.