摘要
本文提出一种用于LSI芯片图象的双子图同构匹配方法.该方法是在芯片分割图象的区域邻接图上搜索同构匹配结点间的对应关系. 同构匹配算法利用启发信息提高搜索的效率.算法根据专门建立的区域相似性度量和环境串匹配值这些判据选取同构匹配起始结点. 文中将详细说明双子图同构匹配法的原理,并提供匹配结果.本算法已在实际中采用.
This paper presents a 'double' subgraph isomorphism method for matching LSI chip images, by which the corresponding relation between isomorphic matched nodes is searched from the region adjacency graph of the segmented chip images.In order to perform the algorithm of isomorphism matching, heuristic information is extracted to improve the searching efficiency. The algorithm uses special criteria of region similarity measure and matching figure of surrounding string to select the starting node of isomorphism matching.In the paper, we present not only the principle of 'double' subgraph isomorphism matching but also the matching result. This algorithm has been employed in practice.
出处
《自动化学报》
EI
CSCD
北大核心
1989年第1期8-15,共8页
Acta Automatica Sinica
