摘要
研制成功一种以SiO2作为主体,掺杂Fe2+离子薄膜制备的气敏元件,对CO气体有良好的气敏特性。它的线性范围为1.2×10-4~8.92×10-3mol·dm-3,检测下限为5×10-5mol·dm-33,响应速度≤5s.本工作以非晶态半导体的Mott-Davis能带模型结合表面吸附理论,初步探讨了该材料的气敏机理,确立了元件阻值R与吸附浓度C的关系方程,以此解释元件的气敏特性.该方程对非晶态SiO2掺杂薄膜是普遍适用的。
SiO2 is used as the main body of the thin film and doped with Fe2+. It has high responsibility to the change of CO. The linearity of response is within the range of 1.2×10-4 -- 8.92×10-3 mol·dm-3. The detection limit is 5 ×10-5mol·dm-3. And the response time is no more than 5 s. In this work, the Mott-Davis Energy Band Model and the theory of surface adsorbtion is used to explain the work machanism of this material.And a equation of the resistance R and the adsorb density of CO is got. This equation is universally suitable for non-crystalline SiO2 doped thin film.
出处
《传感器技术》
CSCD
1996年第1期5-10,共6页
Journal of Transducer Technology
关键词
氧
气敏元件
非晶态
掺杂
二氧化硅
铁
Oxide-semiconductor sensor Non-crystalline SiO_2 Thin film doped with Fe ̄(2+) Gas-sensitive speciality