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双栅氧CMOS工艺研究 被引量:2

Study of Dual Gate Oxide Technology in CMOS Process
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摘要 双栅氧工艺(dualgateoxide)在高压CMOS流程中得到了广泛的应用,此项工艺可以把薄栅氧器件和厚栅氧器件集成在同一个芯片上。文章介绍了常用的两种双栅氧工艺步骤并分析了它们的优劣。在此基础上,提出了一种实现双栅氧工艺的方法。 The dual gate oxide (DGO) technology has been widely used in high-voltage CMOS process, it can integrate both thick gate oxide device and thin gate oxide device in a same chip. Two commonly used technologies are introduced and the advantages and disadvantages of them are discussed. Based on the results a new way to fabricate DGO is proposed in this paper.
出处 《微电子学与计算机》 CSCD 北大核心 2005年第11期5-6,9,共3页 Microelectronics & Computer
基金 国家重点基础研究发展计划项目(2003CB314705)
关键词 双栅氧工艺 高压CMOS流程 Dual gate oxide, High-voltage CMOS process
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参考文献3

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同被引文献10

  • 1李桦,宋李梅,杜寰,韩郑生.用于FED和PDP平板显示高压驱动电路的CMOS器件[J].发光学报,2005,26(5):678-683. 被引量:1
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