Kriging插值与拉丁超立方试验相结合构造电路元模型

Constructing Circuit Metamodel Using Kriging Interpolation Integrated with Latin Hypercube Sampling Experiment

电路系统的设计与优化常常需要参数与指标间简单、直接的模型,即电路的元模型。本文将Kriging插值和拉丁超立方抽样试验相结合构造了低功耗集成运算放大器的元模型。对于这种输出结果为确定值的电路仿真试验,与基于传统部分要因试验设计的多项式回归模型相比,Kriging模型具有更高的预测能力。

The design and optimization of circuit systems often need the direct and simple relation between the parameters and specifications, that is, the metamodel of circuit. A metamodel of low-power integrated operational amplifier is constructed using the Kriging interpolation combined with Latin hypercube sampling experiment. For the circuit simulation experiment that the output value is definite, Kriging model has better predict ability than the polynomial regression model based on the classic fractional factor design.