摘要
在X射线工业计算机断层扫描成像技术(X-ICT)中,X射线源的能谱I0(E)为入射强度随能量E的分布函数。而分布函数I0(E)与E的关系随X射线管电压不同而变化,需要通过试验测定。入射强度分布函数是大量光子运动的统计规律,由于Gauss分布在统计中的普遍性,同时,相关文献对X射线源能谱的试验研究分析,表明X射线源能谱与Gauss分布的相似性,因此可用Gauss分布来描叙X射线源连续谱I0(E)的分布规律。提出了X-ICT中X射线能谱服从Gauss分布的硬化修正模型和新的软件修正程序方法。
Energy spectrum I0 (E) was a distribution function of incident intensity variating with energy E in X- ray industrial computed tomography(X-ICT). However, the relationship between Io(E) and E variated with X-ray tube voltage and it would be known by experiment. Incident intensity distribution function was the statistical rule of photon action. On account of Gauss distribution nature in statistic, it was possible to describe I0 (E) by Gauss distribution and their similarity was shown by literature. The model for hardening correction calculation of the energy spectrum in X-ICT was given and a new correction method was brought forward.
出处
《无损检测》
北大核心
2005年第11期565-568,共4页
Nondestructive Testing
关键词
X射线检测
工业计算机断层扫描成像技术
连续谱
高斯分布
硬化修正
X-radiographic testing
Industrial computed tomography
Continuous spectrum
Gauss distribution
Hardening correction