期刊文献+

X-ICT中连续谱服从Gauss分布的硬化修正研究 被引量:5

Hardening Correction Calculation of the Energy Spectrum of Continuous Spectrum X-ICT by Gauss Distribution
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摘要 在X射线工业计算机断层扫描成像技术(X-ICT)中,X射线源的能谱I0(E)为入射强度随能量E的分布函数。而分布函数I0(E)与E的关系随X射线管电压不同而变化,需要通过试验测定。入射强度分布函数是大量光子运动的统计规律,由于Gauss分布在统计中的普遍性,同时,相关文献对X射线源能谱的试验研究分析,表明X射线源能谱与Gauss分布的相似性,因此可用Gauss分布来描叙X射线源连续谱I0(E)的分布规律。提出了X-ICT中X射线能谱服从Gauss分布的硬化修正模型和新的软件修正程序方法。 Energy spectrum I0 (E) was a distribution function of incident intensity variating with energy E in X- ray industrial computed tomography(X-ICT). However, the relationship between Io(E) and E variated with X-ray tube voltage and it would be known by experiment. Incident intensity distribution function was the statistical rule of photon action. On account of Gauss distribution nature in statistic, it was possible to describe I0 (E) by Gauss distribution and their similarity was shown by literature. The model for hardening correction calculation of the energy spectrum in X-ICT was given and a new correction method was brought forward.
出处 《无损检测》 北大核心 2005年第11期565-568,共4页 Nondestructive Testing
关键词 X射线检测 工业计算机断层扫描成像技术 连续谱 高斯分布 硬化修正 X-radiographic testing Industrial computed tomography Continuous spectrum Gauss distribution Hardening correction
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参考文献5

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同被引文献30

  • 1彭光含,杨学恒,辛洪政.X射线ICT检测中康普顿散射效应的影响与修正[J].无损检测,2004,26(7):336-338. 被引量:2
  • 2彭光含,杨学恒,韩忠,蒲兴成.连续谱X射线在ICT中的能谱硬化修正模型[J].光谱学与光谱分析,2005,25(11):1880-1883. 被引量:8
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  • 6Stephen C Moore, Robert J English, Chanh Syravaah, et al. Simultaneous Tc-99/T1-201 imaging using energy- based estimation of the spatial distributions of contaninant photos[J]. IEEE Transactions on Nuclear Science, 1995, 42(4): 1189-1195.
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