摘要
由BS器件和非BS器件组装的非完全BS电路板仍将在今后相当长时间内广泛存在,如何对它们应用边界扫描测试是板级边界扫描测试技术需要研究的关键问题。本文从非完全BS电路板的测试性优化设计入手,举例说明了基于边界扫描的非完全BS电路板测试诊断技术的原理和过程。
The part-BS PCB boards composed of BS chips and non-BS chips will exist widely for a long time, how to test these boards using boundary scan technique remains a key problem. In this paper, some optimal design methods for testability were proposed firstly, and then the principle and process of boundary scan test on part-BS boards were showed by way of illustration.
出处
《半导体技术》
CAS
CSCD
北大核心
2005年第12期38-41,共4页
Semiconductor Technology
