基于March X算法的SRAM BIST的设计

SRAM BIST Design Based on March X Algorithm

针对LS-DSP中嵌入的128kbSRAM模块,讨论了基于MarchX算法的BIST电路的设计。根据SRAM的故障模型和测试算法的故障覆盖率,讨论了测试算法的选择、数据背景的产生;完成了基于MarchX算法的BIST电路的设计。128kbSRAMBIST电路的规模约为2000门,仅占存储器面积的1.2%,故障覆盖率高于80%。

To 128kb SRAM embedded in LS-DSP, the BIST circuits based on March X algorithm are discussed. The selection of test algorithm and the generation of the data background are discussed at first, based on the fault model and the fault rate of the algorithm. Based on March X algorithm, the BIST circuits are finished. And its scale is about 2000 gates. The area is only about 1.2% of the SRAM, while the fault coverage is higher than 80%.