摘要
用菲涅耳半波带法推出光栅衍射缝间干涉因子暗纹和次极亮纹位置公式,其中次极大位置公式在算次极大强度时有着非常重要的作用。
We educe minimum and secondary maximum stripe location formula of grating diffraction with the method of Fresnel Zone Plate Method. And the secondary maximum stripe location formula of grating diffraction is very important in calculating secondary maximum.
出处
《激光杂志》
CAS
CSCD
北大核心
2005年第6期47-48,共2页
Laser Journal
关键词
菲涅耳半波带法
光栅衍射
条纹位置
Fresnel Zone Plate Method
stripe location
grating diffraction
