摘要
由薄膜表面光热形变简化理论和表面热透镜衍射理论导出表面热透镜信号表达式,从理论上证明了表面热透镜信号和薄膜吸收率的线性关系.应用表面热透镜技术研制了薄膜吸收测量仪,测量结果表明其吸收率测量灵敏度和精度均达10-6量级.
The expression of surface thermal lens(STL) signal is deduced from photothermal deformation theory of thin film surface and STL diffraction theory. The linearity of STL signal to absorption of thin film can be seen from the expression. A measurement apparatus for thin film absorption based on STL technique is constructed. The measuring results prove that the sensitivity and accuracy of this instrument reach 10^-6 magnitude.
出处
《物理学报》
SCIE
EI
CAS
CSCD
北大核心
2005年第12期5774-5777,共4页
Acta Physica Sinica
基金
上海市科学技术委员会光科技专项行动计划(批准号:011661076)资助的课题.~~
关键词
吸收测量
表面热透镜
光热形变
薄膜
absorption measurement, surface thermal lens, photothermal deformation, thin film