摘要
本文提出了一种在毫米波和亚毫米波频段利用电磁开腔测量多层介质样品复介电常数的新方法，在ｋａ波段利用特制的开腔装置建立了一套电磁开腔电介质参数测量系统，并对一些多层介质样品进行了实际测量。测量结果与标称值十分吻合。
A new method for the measurement of complex permittivity of multilayered dielectric samples at millimeterwave and submillimeterwave bands by means of an electromagnetic open resonator is proposed. At Ka band an electromagnetic open resonator dielectric measurement system is designed and constructed using a specially machined open resonator set,and measurements on some multilayered dielectric samples are made,the results are in good agreement with the criterion values.
出处
《电子学报》
EI
CAS
CSCD
北大核心
1996年第9期60-63,共4页
Acta Electronica Sinica
基金
国家教委博士学科点基金
关键词
电磁开腔
介电常数
多层介质样品
测量
Electromagnetic open resonator,Complex source-point theory,Multilayered dielectric sample,Dielectric measurement
