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基于Testpoint事件驱动开发平台的半导体特性综合测试系统

Comprehensive Semiconductor Properties Test System Based on the Event-driven Development Platform of Testpoint
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摘要 Testpoint是一种事件驱动开发平台。在Testpoint下,测试所要求的时序性和循环性能够得到很好的保证。结合GPIB通用接口技术和串行接口技术,用装有接口卡的计算机担任系统的控者,在Testpoint平台下解决了具有广泛意义的并口和串口仪器的程控问题。探讨了Testpoint平台下自动测试系统的实现方法和应用程序的开发方法,设计了半导体特性综合测试系统并完成了对样品的I-V、L-V特性的综合测试。通过Testpoint,完成了测量数据的存储、处理、显示、输出和打印等操作。在实际应用中,达到了改善测试质量和测试速度的目的。 Testpoint is event driven: Test sequencing and looping are easy to do and self--documenting in the object oriented develop ment environment of Testpoint. By using the technology of GPIB and RS232 serial interface, the programming problem of IEEE 488 and RS 232 instruments is resolved in Testpoint and the computer equipped with PC1488 interfaee card is the controller of the system. The resolution of ATS and the developing method of applications in Testpoint are discussed. On the basis of above, the comprehensive test system is designed and I-V and L-V properties of samples are tested. Through Testpoint, the measurement data is saved, processed, displayed, output and printed. Finally, the test quality and speed are greatly improved.
出处 《计算机测量与控制》 CSCD 2005年第12期1312-1314,1324,共4页 Computer Measurement &Control
基金 国家自然科学基金项目资助(69976015)
关键词 Teslpoinl开发平台 事件驱动 自动测试系统 Testpoint development platform event driven automatic test system
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参考文献5

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  • 5Photo Research Inc. spectra colorimeter operating manual[Z].

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