AFM模式下扫描图像质量的影响因素

Influence Factors of Nanomorphology Quality in AFM Mode

介绍了扫描探针显微镜(SPM)的AFM模式的工作原理,观察了聚四氟乙烯胶粒的微观形貌, 并指出影响AFM图像质量的主要因素。

The working principle of AFM mode about scanning probe microscope is introduced in the paper. In addition, the nanomorphologies of PTFE colloid grain are observed. At last, main factors of effection on AFM image are pointed out.