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固液界面附近CdZnTe晶体组份分布及X-Ray测试

The Concentration Distribution and X-Ray Measurement of Nearby the Cd_(1-x)Zn_xTe Solid-liquid Interface
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摘要 利用对垂直布里奇曼Bridgman法生长中的Cd1-xZnxTe晶体停电自然降温的方法获得了具有不同凝固速率的同一块单晶样品。通过红外透射光谱测量方法对停电自然降温前后的单晶区域进行比较,结果显示:停电自然降温后,在固液界面附近存在一个明显的组份过度区,正常凝固的晶体组份分布比较均匀,而快速凝固的结晶区域轴向组份分布梯度较大,同时,通过X-Ray测试结果进一步准确判断固液界面的位置。 Cd1-xZn, Te single crystal with different growth rate was obtained by suddenly power off during vertical Bridgman growth process. The properties of the crystal were investigated by measurement of IR transmission spectrum. The result indicates that an obvious transition area of Zn concentration nearby the solid-liquid interface just before rapid cooling was observed. The distribution of crystal concentration that cooled in normal condition is comparative symmetrical, while the grads of axes oriental concentration distribution that revealed in quick cooling crystal area is bigger. Meanwhile, we can further judge the position of solid-liquid interface by the result of X-Ray Measurement.
出处 《激光与红外》 CAS CSCD 北大核心 2005年第11期853-856,共4页 Laser & Infrared
基金 国家自然科学基金项目(No.50276036)
关键词 Cd1-xZnxTe 快速降温 Zn组份 X-RAY Cd1-xZn, Te suddenly cool Zn concentration X-ray
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参考文献6

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