摘要
电子专业实验中器件性能测试常需要采用高电压小电流电源,对于压敏电阻特性测试实验中,简单的实验装置易出现电位计或样品的损坏,介绍一种使用DC DC变换方式产生高电压小电流电源的方法,运用了稳压与限流保护环节。采用这种设计方法可以提高电子设备的稳定性和可靠性,并保证测量数据的准确性。
Power supply with high voltage and low current is often needed for testing the performance of electron device. Potentiometer or muster is prone to be destroyed if testing the performance of voltage dependent resistor using simple experimental facilities,there is a new design used DC-DC mapping mode to produce power supply with high voltage and low current in this article,voltage stabilization and foldback current limiting are also used in this design. So the stability and security of electron device will be increased if adopting this design,and the veracity of measured value will be ensured.
出处
《现代电子技术》
2005年第24期3-4,共2页
Modern Electronics Technique
关键词
小电流电源
回升区
压敏电阻
电位计
low current power supply
rise region
pressure -sensitive resistance
potentiometer