摘要
N ose-to-nose校准技术可以对任意带宽的取样示波器进行自校准.早期的研究工作集中在对关键信号k ick-ou t脉冲的仿真.本文从不同的角度对微波二极管取样头电路进行了全面的仿真,得到了结论:k ick-ou t脉冲是由于在取样电路的不平衡时选通脉冲的泄漏造成的.并对NTN校准技术从仿真实验到物理实验做了介绍.
The nose-to-nose calibration theory can achieved the self-calibration of the sampling oscilloscope with whatever bandwidth. The early simulation study was focused on the key signal, kickout pulse. We simulated from the different viewpoints, and the fully simulation aimed at a microwave diode sampler head was processed with PSPICE. The conclusion that kick-out is due to the leak of the strobe pulse when the sampler circuit is unbalanced. The simulation and experiment on NTN were discussed also.
出处
《测试技术学报》
EI
2005年第4期394-397,共4页
Journal of Test and Measurement Technology