摘要
采用SI-PIN半导体探测器、241Am激发源和2048通道分析器及自行研制的SI-PIN 2000便携式X 荧光分析仪,对钒钛磁铁矿直接粉末样品中Ti,V,Cr,Mn,Fe,Co,Ni,Cu等8个主、次元素进行了分析 应用研究。文章叙述了所采用的直接粉末样品法的样品盒结构、基体校正的α系数计算方法、重叠干扰校正 原则和漂移校正的方法,并且给出了所选择的分析条件和样品制备方法,分析过程简单、结果准确、分析速 度快,特别适应矿山、冶金的生产原料分析需要,有良好的应用前景,与封闭正比计数器X射线荧光分析仪 相比,检出限降低了1个数量级。
A high resolution （203 eV/Mn Kα ） portable X-ray fluorescence spectrometer has been developed and the measurement of major and minor elements in vanadium titanium magnetite sample was carried out. An 241Am radioactive ,source for X-ray excitation, a Si-PIN detector and a 2048 channel analyzer for the measurement of vanadium titanium magnetite direct powder sample were used. The correction methods for interferences, calibration and drift are presented. The method is simply, accurate and rapid. The detection limit is an order of magnitude lower compared with a sealed proportional counter system.
出处
《光谱学与光谱分析》
SCIE
EI
CAS
CSCD
北大核心
2005年第12期2085-2087,共3页
Spectroscopy and Spectral Analysis
基金
科技部仪器改造研究项目(JG-98-9)资助
关键词
SI—PIN
便携X荧光光谱
钒钛磁铁矿
SI-PIN
Portable X-ray fluorescence spectrometer
Vanadium titanium magnetite
