摘要
对在2004年推向市场的两种商品仪器所采用的两种新的背景校正方法,从方法的原理、演变与形成过程及分析性能等方面进行了较为详细的讨论和解析。
Two types of background correction techniques of commercialized instruments marketed since 2004 are detailed discussed and analyzed in detail based on theory, development and formation, as well as the analytical performance.
出处
《分析试验室》
CAS
CSCD
北大核心
2005年第12期76-80,共5页
Chinese Journal of Analysis Laboratory
关键词
背景校正
一次测量与两次测量
双光电倍增管的一次测量
连续光源下一次测量
Background correction in AAS
Sequentially and simultaneously measurement
Simuhaneouly measure with two PMTs
Simultaneously measure with continum source
