摘要
阐述了细分采样叠加技术的原理和应用。分析了采用细分采样叠加技术对推扫方向调制传递函数(MTF)产生的影响。并在此基础上研究了电路读出时间对细分采样叠加技术的影响。给出了不同采样倍数对应的MTF和电路读出时间所引起的MTF变化。
The principle and application of oversample-superposition technique are described. The effect of the oversample-superposition on scanning directed MTF is analyzed, and based on their characteristics the effect of circuit readout time on oversample-superposition is investingated. The variations of MTF resulting from correspondent MTF and circuit readout time at different sampling multiple are given.
出处
《半导体光电》
EI
CAS
CSCD
北大核心
2005年第6期563-565,共3页
Semiconductor Optoelectronics
关键词
红外焦平面阵列
细分采样叠加
调制传递函数
infrared focal plane array
oversample-superposition
modulation transferfunction（MTF）
