摘要
提出了一种基于波导法的纳米薄膜材料电磁参数测量的新方法,给出了该方法的基本原理。与常规波导测量方法相比,该方法根据纳米金属薄膜材料的特点,简化了求解算法,只需测出加载薄膜波导开路与短路时的复反射系数,即可求出薄膜的介电常数与导磁率,使测量过程简单高效并具有较高的精度。
A new method based on waveguide technique for measuring the permittivity and permeability of nanometal film is presented and its theory is discussed here. Compared with usually waveguide technique, the method is simplified according to the speciality of nanometal film. Only measuring the reflection coefficients of open and short circuit, the permittivity and permeability of nanometal film will be obtained accurately and easily.
出处
《微波学报》
CSCD
北大核心
2005年第6期39-42,共4页
Journal of Microwaves
关键词
微波测量
纳米金属薄膜电磁参数测量
微波多端口反射计
Microwave measurement, Permittivity and permeability measurement of nanometal film, Microwave multi-port reflectometer
