确定断裂表面晶体学取向的电子背散射衍射方法

Method for determining crystal orientation of fracture facet using electron back-scattering diffraction

利用扫描电镜中带多自由度的样品台和电子背散射衍射系统(EBSD)研究了断口的晶体学定向方法。对于镍拉伸变形后的沿晶断裂表面,利用EBSD确定了晶粒与样品坐标之间的晶体学取向关系,通过样品台倾转获得断裂面与样品之间的几何对应关系,从而定出样品沿晶断裂面主要的晶体学位向是{100}。

A method was proposed to characterize the crystallographic orientation of fracture surface facets in a scanning electron microscope. Firstly, the orientation of grain abutted on the facet was measured relative to the reference axes in Ni sample after tensile testing using electron back-scattering diffraction analysis. Secondly, the inclination of the facet with respect to the same reference axes was determined by using double-tilting stage. Finally, the direction of fracture facet of Ni tension sample was obtained to be {100} .