摘要
根据星载电子设备CMOS电路中现场可编程逻辑阵列(FPGA)闩锁的发生机理,提出了输入/输出回路的抗锁定、二次屏蔽防止单粒子触发锁定等遏制闩锁触发条件,以及工作电源限流、闩锁检测与解除等遏制闩锁维持条件的设计,并给出了应用检测电路、板级锁定检测与解除、电流敏感器件检测电流和FPGA闩锁监测等应用实例。
According to the latch-up mechanism of field programmable gate array (FPGA) in CMOS circuit for onboard electronics, the designs for anti-latch-up triggering conditions such as anti-latch-up in input/output circuit and secondary shielding to prevent single event, anti-latch-up maintenance such as operation current limitation and latch-up detection and release were put forward in this paper. The application examples of employed test circuit, board latch-up detection and release, current detection by current sensor and FPGA latch-up monitoring were also given.
出处
《上海航天》
北大核心
2005年第6期51-54,共4页
Aerospace Shanghai
关键词
星载电子设备
现场可编程逻辑阵列
抗闩锁
设计
可靠性
On-board embedded computer
Field programmable gate array
Anti-latch-up
Design
Reliability