模数转换器的内建自测试结构
Self-testing structure built-in analog to digital converter
摘要
介绍了模数转换器的内建自测试结构、工作原理和用途。
Self - testing structure built - in analog to digital converter and its working mechanism, uses were introduced and discussed.
出处
《黑龙江电力》
CAS
2005年第6期461-464,共4页
Heilongjiang Electric Power
关键词
片上锯齿波发生器
CNOS工艺
内建自测试
sawtooth wave producer on chip
CMOS procedure
self - testing built - in
参考文献4
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1S.Bernard,F.Azais,Y.Bertrand and M.Renovell,“A High Accuracy Tiangle-Wave Signal Generalor for On-Chip ADC Testing”.Proceedings of the Seventh IEEE European Test Workshop,2002.
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2Benoit Provost,Edgar Sanchez-Sinencio,“On-Chip Ramp Generators for Mixed-Signal BIST and ADC Self-Test”,IEEE Journal of Solid-State Circuits,pp.263-273,2003.
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3F.Azais,S.Bernard,Y.Bertrand,M.Rnovell,“Analog build-in saw-tooth generator for ADC histogram test”,Microelectronies Journal,pp.781-789,2002.
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4S.Bernard,F.Azais,Y.Bertrand and M.Renovell,Analog BIST generator for ADC testing,52,2000.
