SoC中混合信号的测试

Test of Mixed Signal in SoC

随着经济社会的发展,人们对消费类电子的多媒体功能要求越来越高;这极大促进了SoC中混合信号工艺的运用,但是随之而来的是SoC在测试上遇到了前所未有的难题,因为混合信号电路的集成使他不同于纯数字电路IC的测试。SoC中混合信号的测试是SoC进一步发展的瓶颈,这对研究提出了紧迫的要求。介绍SoC中混合信号测试面临的主要问题,着重讨论了混合信号边界扫描测试,内置自测试方法(BIST)等测试手段及各自的特点。展望了SoC混合信号测试的研究方向。

With the development of economy and the society, people＇s requirement on the multimedia function of consumption electronic product is higher and higher. This kind of demand greatly promotes tl,e using of mixed - signal craft in SoC. The integrating of mixed signal circuit makes SoC use a special test method which is difficult from the test of the purely digital circuit IC. A following problem is the testing of mixed signal in SoC, which was not met in the past. The test of m＇xed signal is the bottleneck of the SoC development,and this proposes urgent demand to the research. This article focuses on the application of mixed signal in SoC and quotes a pressing request against the research on the test of mixed signal. In the article, the author introduces the major problems in the test of mixed signal in SoC,the boundary scan of mixed signal and the characters of BIST are discussed in details. At last,the author forecasts the future research of the test of mixed signal.