小角X光散射中干涉效应的判断与处理

Methods to Distinguish and Handle the Interference in SAXS

小角X光散射是当X光照射到物质上时发生的在原光束附近小角度范围内的电子相干散射,凡是存在纳米尺度的电子密度不均匀区的物质均会产生小角X光散射现象,因此它是表征纳米、多孔材料结构的理想手段。SAXS中的有关理论一般仅适用于稀疏体系,对于密集体系,往往会产生干涉现象。本文简要总结了目前文献中有关干涉效应的判断与处理方法。

Small angle X- ray scattering （SAXS） originates from spatial fluctuations of the electronic density within a material. It is ideally suitable for investigating the geometric structure of inhomogeneous material containing regions in which fluctuation or variation in electron density extends over distances of about 0.4nm to 200nm （e. g. ,particulate or porous materials）. Most theories in SAXS are only applicable to sparse systems. For concentrated systems, there will appear interference to scattered intensities. This short paper briefly introduces the methods to distinguish and handle the interference in SAXS literatures.