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X射线用Kirkpatrick-Baez显微镜成像质量的研究 被引量：5

Image quality with Kirkpatrick-Baez microscope in hard X-ray
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摘要 对惯性约束聚变的一种重要诊断方法——Kirkpatrick-Baez型结构显微镜成像方法进行了研究。计算了Kirkpatrick-Baez型结构显微镜的主要像差．并分析得出：造成轴上点像差的主要因素是球差，占像差的94％。基于光线追迹方法模拟出这种结构的成像过程，比较了不同反射镜长随视场变化对物面分辨率的影响，发现为了保证物面的空间分辨率能达到ICF研究要求视场应尽量控制在200μm以内。最终得出能量在8keV、视场为200μm，分辨率小于10μm的Kirkpatrick-Baez型结构的模型。提出在装凋过程中重要公差计算方法，得到数值孔径为0．0037时，角度装调公差应在-0．087°～0．067°范围内。 An important diagnosis method Kirkpatriek-Baez microscope system in ICF experiments was researched. The brief aberration of the Kirkpatrick-Baez microscope was calculated. The main aberration, spherical aberration was analyzed, and the spherical aberration is 94% of the total aberration. The configuration was simulated by the ray tracing method. Resolutions in different fields and mirror-lengths were compared. The modal of Kirkpatrlck-Baez microscope was made in computer with 10μm resolution at 8 keV. It was studied about the adjusting tolerance method of Kirkpatrick-Baez microscope. When numerical aperture is 0.003 7, the angle error range is -0. 087°-0. 067°.
作者 潘宁宁 王占山 顾春时 秦树基 陈玲燕
机构地区 同济大学物理系
出处 《强激光与粒子束》 EI CAS CSCD 北大核心 2006年第1期61-65,共5页 High Power Laser and Particle Beams
基金 国家863计划项目资助课题
关键词 掠入射成像系统 X射线 光线追迹 空间分辨率 角度公差 Grazing incidence image system X-rays Ray traeing Spatial resolutions Angle error
分类号 TL651 [核科学技术—核技术及应用]
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参考文献14

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同被引文献46

  • 1顾春时,王占山,王风丽,张众,穆宝忠,秦树基,陈玲燕.X射线Kirkpatrick-Baez显微镜用超反射镜的研制[J].强激光与粒子束,2006,18(7):1095-1098. 被引量：5
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  • 4Marshall F J, Allen M M, Knauer J P, et al. A high resolution X-ray microscope for laser-driven planar foil experiments[J]. Phys Plasmas, 1998, 5(4):1118 1123.
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  • 10Marshall F J, Allen M M, Knauer J P. A high-resolution X-ray microscope for laser driven planar foil experiments[_J. Phys Plasmas, 1998, 5(4) :1118-1124.

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强激光与粒子束
2006年 第1期

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