摘要
提出一种新型的P阱NMOS功率集成电路制作技术。理论分析表明,该技术可以较好地实现VDMOSFET与P阱NMOS电路的兼容集成。实验结果表明,利用该技术获得的器件结构具有良好的击穿特性。
A novel technique is proposed for p-well NMOS PIC fabrication.Theoretical analysis on the typical structure shows that VDMOS cells and p-well NMOS IC'S can be compatibly integrated into one chip. Experiment results demonstrate that p-n junctions obtained with the new technique have the same breakdown properties as the conventionally diffused ones.
出处
《微电子学》
CAS
CSCD
1996年第3期195-197,共3页
Microelectronics