摘要
根据P rote l DXP傅立叶分析仿真结果,分析了集成同步解调器中晶体管的闪烁噪声产生输出噪声的过程。通过改变电路仿真参数,得出相应仿真数据,结合理论模型对仿真数据进行了分析。得出闪烁噪声增益随载波信号幅度递减。
The process of producing and output flicker noise in the transistor of synchronous demodulator is analyzed according to the results of the analysis and simulation of protel DXP. By varying the simulation parameters of the circuit,the corresponding data are obtained and analyzed with a theoretical model. The results indicate that the flicker noise increases while the carrier wave amplitude increases.
出处
《安庆师范学院学报(自然科学版)》
2005年第4期63-66,共4页
Journal of Anqing Teachers College(Natural Science Edition)