液晶盒中聚酰亚胺静电击伤的观测实验

The Experiment of Observing PI Damage Causing by Static Electricity

利用超扭曲向列相(SuperTwistNematic,STN)液晶关态光学原理结合偏光显微镜与扫描电镜观察液晶中聚酰亚胺(PI)静电击伤,介绍PI静电击伤产生的原因以及预防措施,同时介绍如何判定静电击伤。该实验应用两种方法对静电击伤进行鉴别,并把它和由尘粒引起的白点严格区别开来。

We give the expression of off-state Super Twist Nematic Liquid Crystal Display transmission. Using scanning electron microscope, we have observed the PI damage causing by static electricity. We also suggested how to judge this damage and how to avoid it. By this method we can differentiate ＇white point＇ causing by static electricity from ＇white point＇ causing by dust.