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SnAgCuY钎料高温时效过程的显微组织演化 被引量:4

Microstructure Evolution of SnAgCuY Lead-free Solders at High Temperature Aging
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摘要 研究了无铅钎料合金Sn3.8Ag0.7Cu高温时效过程中显微组织,特别是金属间化合物(IMC)的演化规律,以及稀土Y的添加对其产生的影响。结果表明:在高温时效过程中合金内部组元发生扩散与重组,伴随着共晶组织的逐渐溶解,新的IMC在组织内部呈球形弥散析出。结晶初期形成的具有规则形状的较粗大的IMC逐渐发生解体,树枝状富Sn相逐渐取代共晶组织成为受腐蚀的对象。随着时效时间的延长,合金内部各组元的成分也在不断发生变化。 The evolution of microstructure especially the IMC at high temperature aging process had been systematically investigated and the effect of trace amount rare earth Y also had been studied. The results show that diffusion and reassemble occur in the constituent phase of solder alloy during aging process. At the same time, new formed IMC in the form of sphere is dispersedly separated out accompanied with the dissolution of eutectic phase. Thick IMC, which was produced at initial crystalline stage and uniform in the form, is gradually disorganizing. Arborous β-Sn is eroded in place of eutectic phase and composition of the constituent phases is continuously changing with the aging time.
出处 《电子元件与材料》 CAS CSCD 北大核心 2006年第2期52-54,共3页 Electronic Components And Materials
基金 国家863高技术资助项目(No.2002AA322040)
关键词 金属材料 无铅钎料 SnAgCu合金 稀土Y 高温时效 metal materials lead-free solder SnAgCu alloy rare earth Y high temperature aging
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  • 1Richard B. Lead - free soldering - world's apart, National Physical Laboratory[ EB]. NPL News, UK, http://www.lead - free. org, 2004.
  • 2Chen ZG, Shi YW, Xia ZD et al. Properties of leadfree solder SnAgCu containing minute amount of rare earth [J]. Journal of Electronic Materials, 2003, 32 (4) :235 - 243.
  • 3Nimmo K European and international roadmaps for leadfree technology [ EB ]. Soldertee at Tin Technology,UK, http://www. lead - free. org, 2004.

共引文献26

同被引文献30

  • 1李擘,史耀武,夏志东,雷永平,郭福.添加微量稀土元素的SnAgCu无铅钎料的研究[J].电子工艺技术,2004,25(5):193-198. 被引量:5
  • 2王烨,黄继华,张建纲,齐丽华.Sn-3.5Ag-0.5Cu/Cu界面的显微结构[J].中国有色金属学报,2006,16(3):495-499. 被引量:17
  • 3郝虎,田君,史耀武,雷永平,夏志东.SnAgCuY系稀土无铅钎料显微组织与性能研究[J].稀有金属材料与工程,2006,35(A02):121-123. 被引量:27
  • 4程从前,赵杰,杨朋,朱凤.Sn-3Ag/Cu接头在钎焊和时效中IMC的生长和晶体取向分析[J].材料热处理学报,2006,27(4):82-86. 被引量:5
  • 5FOLEY J C,GICKLER A, LEPREVOST F H. Analysis of ring and plug shear strengths for comparison of lead-free solders[J]. Electronic Materials, 2000, 29(10) :1258-1263.
  • 6KANG S K,SARKLEI A. Lead-free solder for electronic packaging [J]. Electronic Materials, 1994,,23(8) : 701-708.
  • 7MA X,WANG F J, QIAN Y Y, et al. Development of Cu-Sn intermetallic compound at Pb-free solder/Cu joint interface[J]. Materials Letters, 2003,57:3361-3365.
  • 8LEE Y G, DUH J G. Characterzing the formation and growth of inter-metallic compound in the solder joint[J]. Materials Science, 1998,33(23):5569-5572.
  • 9CHADA S, LAUBW, FOURNELLE R A, et al. An improved mumerical method for predicting intermetallic layer thickness developed during the formation of solder joints on Cu substrate[J]. Electronic Material, 1999,28(11):1194-1202.
  • 10VIANCO P T, HLAVA P F, KILGO A C. Intermetallic compound layer formation between copper and hot-dipped 100In, 50In-50Sn, 100Sn, and 63Sn-Pb coatings[J]. Electronic Materials, 1994, 23(7): 583-594.

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