X射线荧光光谱法测定Zn镀层质量厚度及计算谱线选择问题研究

Determination of the mass thickness of zinc coating by X-ray fluorescence spectrometry

用X射线荧光光谱法测定了Fe基上Zn镀层的质量厚度;研究了厚度不同时选用不同谱线计算对测定结果的影响,发现在镀层质量厚度较小时(约<14mg/cm2)测量Zn元素的Kα线,质量厚度较大时选择Zn的Kα和Fe的Kα线共同计算,用纯元素和相似标样校正测定结果之间的偏差最小;用纯元素作校正标样测定了3个标准样品的Zn镀层质量厚度,计算结果与标准值符合得较好。

The thickness of Zn coating on Fe substrate was measured by X-ray fluorescence spectrometry. The influence of the analytical lines measured on the results with difference thickness was studied. It is found that the differences between the results corrected by pure element bulk samples and by type standards are little, when mass thickness of coating 〈 14 mg/cm^2 and only Zn Kα llne are used, or when mass thickness of coating 〉 14 rag/era2 and Fe Kα line are included. The mass thicknesses of three standard specimens are also determined as unknown samples, corrected by pure element bulk samples. The results are well in accordance with the certified values.