摘要
综述了扫描探针显微镜在导电聚合物研究中的各种用途,如形貌观察、纳米加工、微观电学性质测量、电化学研究、原位测量膜厚变化等;同时对扫描探针显微镜中一些重要形式和相关技术做了介绍。并对导电聚合物研究中扫描探针显微镜未来的发展趋势做了展望。
The application of scanning probe microscopy（SPM） in intrinsically conducting polymer research is briefly reveiewed, including in morphology observation, nanofabrication, microcosmic electrical property measurements, electrochemistry research, in-situ measurement of film thickness change and so on. At the same time, some important variations of SPM and related techniques are briefly introduced. Finally, the future development trend of SPM in the study of intrinsically conducting polymers is described.
出处
《应用化学》
CAS
CSCD
北大核心
2006年第2期117-121,共5页
Chinese Journal of Applied Chemistry
基金
国家自然科学基金(20475053
30070417)
吉林省杰出青年基金资助项目(200501027)
关键词
扫描探针显微镜
导电聚合物
综述
Scanning Probe Microscopy,intrinsically conducting polymer,review
