期刊文献+

电子封装中超声波线焊的三维/二维非线性有限元分析 被引量:3

3D/2D Nonlinear Finite Element Analysis of Ultrasonic Wire Bonding in Electronic Package
下载PDF
导出
摘要 用三维和二维的有限元方法对超声波线焊进行了模拟,其间考虑了材料非线性、几何非线性和接触边界非线性的影响。实验显示,金线和焊接平台的接触界面为长椭圆形状,其中焊接部位发生在接触界面的周边。有限元模拟的结果显示,最大的接触压力以及由此导致的最大摩擦能密度也发生在接触界面的周边,从而解释了实验现象。分析了各工作参数对超声波线焊产生的影响。结果表明,并不是压碶按压力越高,接触压力就越大,这意味着提高压碶按压力不一定能提高焊接的可能性,有限元分析有助于确定合适的压碶按压力。 The ultrasonic wire bonding process was simulated by 3D and 2D finite element method. The non--linearity in geometry, material properties and contact boundary was considered in analysis. It shows in experiments that the contact area between the wire and the pad has possesses long elliptical shape, and the welded area was periphery of the contact area. The FEM analyses indicate that maximum contact pressure and maximum friction energy intensity caused by ultrasound also occurs always at the periphery of contact area, which explain the weld formation in experiments. Another focus was on how the operating parameters affect the ultrasonic wire bonding. It shows in analysis that the higher bond force does not mean higher contact pressure, and elevating the bond force is not always useful for the bondability, and FEM analysis can be used to determine the appropriate bond force.
作者 丁勇 郑荣跃
机构地区 宁波大学
出处 《中国机械工程》 EI CAS CSCD 北大核心 2006年第3期260-263,267,共5页 China Mechanical Engineering
基金 宁波市青年(博士)科学基金资助项目(2005A620009)
关键词 非线性有限元法 超声波线焊 焊接可能性 接触压力 nonlinear finite element method ultrasonic wire bonding wire bondability contact pressure
  • 相关文献

参考文献10

  • 1Harman G G, Wire Bonding in Microelectronics.New York: McGraw-Hill, 1997.
  • 2Hamidi A, Beck N, Thomas K, et al. Reliability and Lifetime Evaluation of Different Wire Bonding Technologies for High Power IGBT Modules. Microelectronics Reliability, 1999, 39: 1153-1158.
  • 3巴斯KJ 傅子智(译).工程分析中的有限元法[M].机械工业出版社,1991..
  • 4Ikeda T, Miyazaki N, Kudo K, et al. Failure Estimation of Semiconductor Chip During Wire Bonding Process. J. Electron. Packaging, 1999, 121(1):85-91.
  • 5王毅.高密度高性能电子封装技术的现状与发展[J].微电子技术,1998,26(Z1):1-22. 被引量:9
  • 6Callister J. Material Science and Engineering: An Introduction. New York: John Wley & Sons, 2003.
  • 7Yao Q, Qu J. Three-dimensional Versus Two-dimensional Finite Element Modelling of Flip-chip Packages. J. Electron. Packaging, 1999, 121 (3):196-201.
  • 8Kim J K, Au B P L. Effects of Metallisation Surface Characteristics on Gold Wire Bondability of Organic Printed Circuit Boards. J, Electron. Mater,2001, 30(8): 1001-1011.
  • 9Joshi K C. The Formation of Ultrasonic Wire Bonding Between Metals. Weld, J, 1971, 50(6): 840-858.
  • 10Sheaffer M, Levine L. How to Optimize and Control the Wire Bonding Process: Part Ⅱ. Solid State Technol, 1991, 34(1): 54-62.

共引文献14

同被引文献17

  • 1王万彦.单作用伸缩式套筒液压缸密封件的设计改进[J].液压与气动,1994,18(2):45-46. 被引量:1
  • 2DING H, XIONG Z H. Motion Stages for Electronic Packaging: Design and Control [J].IEEE Robotics & Automation Magazine, 2006, 13(4): 51-61.
  • 3TUMMALA R R. Fundamental of Microsystems Packaging [M]. New York : McGraw - Hill , 2001.
  • 4Harman G G. Wire Bonding in Microelectronics[M]. New York: McGraw- Hill, 19 9 7.
  • 5Tummala R R. Fundamental of Microsystems Packaging [M]. New York : McGraw- Hill, 2001.
  • 6Ashby M F, Abulawi J, Kong H S. Temperature Maps for Frictional Heating in Dry Sliding[J]. Tribology Trans, 1991,34(4) :577-587.
  • 7Bhushan B. Introduction to Tribology[M]. New York: :John Wiley & Sons, Inc,2002.
  • 8Kalin M,Vizintin J. Comparison of Different Theo retical Models for Flash Temperature Calculation Under Fretting Conditions [J]. Tribology Intern, 2001,34(12) : 831-839.
  • 9Schneuwly A,Groning P,Schlapbah L,et al. Bondability Analysis of Bond Pads by Thermoelectric Temperature Measurements[J]. J. Electr. Mater., 1998, 27(11) : 1254-1261.
  • 10ASM International Handbook Committee. ASM Handbook, Materials Park[M]. Ohio.. ASM International, 1990.

引证文献3

二级引证文献4

相关作者

内容加载中请稍等...

相关机构

内容加载中请稍等...

相关主题

内容加载中请稍等...

浏览历史

内容加载中请稍等...
;
使用帮助 返回顶部