摘要
以丁醇钛,硝酸铋为原料,用Sol-gel技术制备出Bi4Ti3O12铁电薄膜。利用XRD,SEM手段分析了薄膜的结构和表面形貌。结果表明,薄膜呈现单一的展状钙钛矿结构和良好的C轴择优取向。薄膜在Si(100)衬底和Pt/Ti/Si衬底上的取向率分别为90%和68%,薄膜的表面均匀。测试结果表明,薄膜具有良好的铁电和介电性质,剩余极化强度为5.0μC/cm2,矫顽场强为70kV/cm。
Ferroelectric Bi4Ti3O12 thin films have been prepared on Si and Pt/Ti/Si substrates using Sol-gel method by using of bismuth nitrate and titanium butoxide as starting materials,respectively.The structures of the thin films were examined by the XRD.The results show that the thin films are single phase Bi4Ti2O12 structure and have good c - axis preferred orientation. The oriented ratio of the thin film is about 90%on Si substrate,but is only 68% on Pt/Ti/Si substrate.The surface of thin film is even.The thin films show good dielectric and ferroelectric properties.
出处
《人工晶体学报》
EI
CAS
CSCD
1996年第1期54-57,共4页
Journal of Synthetic Crystals
关键词
铁电薄膜
溶胶凝液法
铁电性质
铁氧体
Bi4Ti3O12
ferroelectric thin films
Sol-gel method felectric properties