集成电路高层故障模型评估方法

Approach to Evaluate the High-level Fault Models

给出了利用测试向量进行评估的基本理论方法,以及强对应集和弱对应集的定义及推论。按该方法,依不同模型生成测试向量,然后进行相互间的覆盖计算,以比较模型的优劣。最后对ITC99-benchmark电路进行实验,结果表明该方法是有效的。

This article presents the theory and method to evaluate the high level fault models by test patterns. The strong corresponding set and weak corresponding set are defined. The deduction is also presented. According to this method, test patterns are generated and then applied to different fault models. The result shows fault model is more effective. The experiment conducted on the benchmark of ITC99 reveals that the method is effective.