摘要
提出了一种用于超深亚微米集成电路电源网格IR-drop验证的新方法。该方法以遗传算法为基础,与已有的分析方法相比,该方法兼具静态IR-drop分析法和动态IR-drop分析法的优点,适用于包含大型组合模块的超大规模集成电路,可主动寻找电路中最大IR-drop。通过对ISCAS85电路实现的验证,发现了静态分析法不能发现的芯片边缘IR-drop问题。实验结果验证了该方法的正确性与有效性。
A novel GA based algorithm for UDSM VLSI power grid verification is presented, Unlike other existing techniques, this algorithm possesses merits of both the static and dynamic IR-drop analysis methods. For large scale combinational circuits, the maximum IR-drop can be automatically found following the proposed scheme. Application on ISCAS 85 example shows potential IR-drop faults which are unknown by using traditional methods, The correctness and efficiency are both verified by experiments.
出处
《电路与系统学报》
CSCD
北大核心
2006年第1期1-5,共5页
Journal of Circuits and Systems
基金
国家863计划资助项目(2002AA1Z1460)
