针孔点背光技术实验

Experiments of Point-projection Backlighting Using Pinholes

在“星光Ⅱ”装置上进行针孔点背光技术的演示实验.利用激光辐照φ50μm的小孔产生的堵孔效应使X光的脉宽缩短,起到类似于短脉冲点背光源的作用.另外利用成像方法,实验演示了由面背光方式获得点背光技术,称之为点针孔背光技术.实验结果表明结合堵孔效应和点背光方式,能获得与点背光同样的结果,这样可以避开点背光对激光器较为苛刻的要求.

X-ray backlighting is a powerful tool for diagnosing a large variety of high-density phenomena. In pinhole-assisted point-projection backlighting, pinholes are placed a small distance away from the backlighter source to produce images with large field of view. The techniques of point backlighting using pinhole was experimentally demonstrated on Xingguang-Ⅱ facility （XG-Ⅱ ） with 80 J, 1 ns, 351 nm laser pulse. The pinhole drilled on gold in diameter of 50 μm was irradiated by laser beam and pinhole closure was produced in order that x-ray pulse width was shortened, and then the function similar to point backlighting was obtained. The experimental results shown that the pinhole-assisted point-projection backlighting was feasible.