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晶体器件中的光线追迹法 被引量:2

RAY TRACING FOR CRYSTAL COMPONENTS
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摘要 本文以Wollaston棱镜为例将作者原先提出的晶体中光线轨迹公式用于具有多个折射面的晶体器件,阐明公式中各物理量的计算方法,把它与坐标转换关系相结合,提出了一种较简单的光线追迹法,用以研究晶体器件的象差。为晶体器件设计提供了一种新方法。 In this paper,taking Wollaston prism for example,we discuss how the general ray tracingformulae developed by Zhang ̄3 are used to the crystal components and the calculating method of allparameters in the formulae is explained.The formulae are combined with the transformations hetweenthe coordinates of major axes and the coordinates of each boundary planes of crystals and a new andsimpler ray tracing method for crystal components is presented.The method can be used to analysis ofaberration and design of crystal components.
作者 张为权
机构地区 浙江丝绸工学院
出处 《光子学报》 EI CAS CSCD 1996年第1期79-84,共6页 Acta Photonica Sinica
关键词 光线追迹 渥拉斯顿棱镜 晶体器件 Ray tracing Wollaston prism Aberration
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参考文献2

  • 1孙为权,Appl Opt,1993年,22期,4204页
  • 2孙为权,Appl Opt,1992年,34期,7328页

同被引文献13

  • 1张娟,刘立人,周煜.一种模拟双折射可调谐密集波分复用滤波器的设计[J].中国激光,2004,31(10):1227-1230. 被引量:3
  • 2D. R. Preuss, J. L. Gole. Three-stage birefringent filter tuning smoothly over the visible region: theoretical treatment and experimental design[J]. Appl. Opt., 1980, 19(5): 702-710.
  • 3Shidong Zhu. Birefringent filter with tilted optic axis for tuning dye lasers: theory and design[J]. Appl. Opt., 1990, 29(3):410-415.
  • 4Jurgen Mented, Eberhard Schmidt, Thomas Marndis.Birefringent filter with arbitrary orientation of the optic axis: an analysis of improved accuracy[J]. Appl. Opt. , 1992, 31(24):5022-5029.
  • 5Xinglong Wang, Jianquan Yao. Transmitted and tuning characteristic of birefringent filters [J]. Appl. Opt. , 1992,31(20): 4505-4508.
  • 6Weiquan Zhang. Accurate formulas of transmission ratio and tuning characteristics of birefringent filters [J]. Optik, 2000,111(2): 85-89.
  • 7Weiqan Zhang. New phase shift formulas and stability of waveplate in oblique incident beam[J]. Opt. Commun. , 2000,176:9-15.
  • 8Weiquan Zhang. General ray tracing formulas for crystal [J].Appl. Opt. , 1992, 31(34): 7328-7331.
  • 9C. Stephen et al.. Polarization ray tracing in ani,sotropic optically active media. I. Algorithms[J]. J. Opt. Soc Am. (A), 1993,10(11) : 2371-2393.
  • 10W. Q. Zhang. Reflectance, transmittance and total internal reflection in biaxial crystal[J].Optik, 1996, 104(2): 67-71.

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