酞菁钴薄膜的折射率及吸收特性

Refractive Index and Absorption of Cobalt Phthalocyanine Thin Film

通过真空镀膜法在单晶硅片上制备了酞菁钴（ＣｏＰｃ）薄膜。

A cobalt phthalocyanine (CoPc) thin film was obtained by vacuum deposition on a single crystal silicon. The ellipsometric spectra of CoPc thin film have been investigated on a scanning ellipsometer with the analyser and polarizer rotate synchronously. The spectrum is explained with its energy levels.